NEW Pelcotec™ Etched Si CDMS

Marsoni

M251S

$298.08

Get it in 3 business days with 1 day shipping. Friday, May 29

NEW Pelcotec™ Etched Si CDMSAvailable as NIST Traceable or as Certified against NIST Standard Easy to use and very useful for quick and precise SEM, FE SEM, FIB, CD SEM, LM, and AFM magnification calibration in the X axis. Fully featured and traceable calibration standards for a wide measurement range. They are made using the latest semiconductor and MEMS manufacturing techniques for etching features yielding superior line edge quality (Line edge roughness of + 0. 3nm per 1um

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