Critical Dimension (CD) Calibration Test Specimens for SEM, FIB and AFM

Critical Dimension (CD) Calibration Test Specimens for SEM, FIB and AFM

Marsoni

M251S

$364.99

Get it in 3 business days with 1 day shipping. Friday, May 29

Critical Dimension (CD) Calibration Test Specimens for SEM, FIB and AFM"Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um structure see

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